Low Energy Electron Microscope
Low energy electron microscopy (LEEM) (Fig. 1) utilizes low energy, elastically backscattered electrons to image surfaces with high spatial and temporal resolution. Advantages of LEEM over other surface imaging techniques are:
Real-time imaging capability
Several unique contrast mechanisms for image formation
Operation under extreme conditions
LEEM has been applied to a variety of problems including surface structure and morphology determination, dynamic processes (e.g., epitaxial growth, desorption, island decay, oxidation), surface and thin film magnetism. The LEEM at HKUST is one of only about a dozen in the world.