Title: |
RTE MEASUREMENT WITH XE52+ IONS CHANNELED IN A SI CRYSTAL
ANDRIAMONJE, S; CHEVALLIER, M; COHEN, C; CUE, N; DAUVERGNE, D; DURAL, J; GENRE, R; GIRARD, Y; KIRSCH, R; LHOIR, A; POIZAT, JC; QUERE, Y; REMILLIEUX, J; SCHMAUS, D; TOULEMONDE, M |
Source: |
PHYSICS LETTERS A 164(2): APR 13 1992
DOI:10.1016/0375-9601(92)90700-V |