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Chemical vapor deposition system
Photoluminescence system
Physical property measurement system
PS-OPA tunable laser system
Scanning electron microscope
Semiconductor device characterization facilities
SQUID
Transmission electron microscope (TEM)
Ultra-high vacuum scanning tunneling microscope
Vacuum deposition system
XPS and Auger surface analysis system
PC cluster
Oxford SpectroMag 4000 system
Cluster deposition system
Differential scanning calorimetry
Femtosecond laser system
Focused ion beam system
Low energy electron microscope (LEEM)
Magnetron sputtering system
Micro Raman system
Modulated photo-reflectance system
Molecular beam epitaxy (MBE) system
Oxford SpectroMag 2000 system
Materials Characterization & Preparation facility (MCPF)
DEPARTMENT OF PHYSICS
The Hong Kong University of Science and Technology
Clear Water Bay, Kowloon, Hong Kong
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The Center for the Development of the Gifted and Talented
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