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ALTMAN Michael S 歐德孟
PhD, Brown University
Professor
Tel 2358 7506
Fax 2358 1652
Email phaltman
Office Room 4463
Professor Michael Altman obtained his BA degree with Honors (1982) from the University of Pennsylvania and his ScM (1984) and PhD (1988) degrees from Brown University in the United States. He was awarded an Alexander von Humboldt Foundation Research Fellowship (1988-1990) to pursue post-doctoral research at the Technische Universitaet Clausthal in Germany. He joined the Physics Department of HKUST in 1991, and has served as Department Head since 2010. In recognition of his teaching excellence, Professor Altman was honored with the HKUST School of Science Teaching Award in 1997.

Professor Altman’s experimental research program is aimed at understanding fundamental structural, electronic, magnetic and dynamical properties of surfaces, interfaces, thin films and surface-supported nanostructures. Several topics that he focuses on are related to the bottom-up fabrication and morphological control of thin films and nanostructures. These topics include, for example, collective surface diffusion and growth, step motion kinetics and step morphology, and quantum size effects. Professor Altman’s research on surface alloy formation and stability is driven by his interest in the potential functionality of surface alloys as novel substrates. Professor Altman also pursues interests in magnetism in reduced dimensions by studying the magnetic properties of macroscopic ultrathin films and a running parallel program on spin polarized field emission and spectroscopy of nanoscopic magnetic tips.

Professor Altman utilizes a variety of cathode lens electron microscopies - conventional and spin polarized low energy electron microscopy (LEEM and SPLEEM), spectroscopic and x-ray circular magnetic dichroism photoemission electron microscopy (SPELEEM and XMCD-PEEM) - combined with conventional low energy electron diffraction techniques and micro-low energy electron diffraction from very small selected areas. Prof Altman has contributed to the development of these experimental techniques as co-inventor of SPLEEM and through his development of image formation theory and explanations of phase contrast mechanisms.
Research Areas
Surface, interface and thin film physics; nanoscience
Representative Publications
  • “Greigite Formation by Vapor-Solid Reaction”, E. Bauer, K.L. Man, A. Pavlovska, A. Locatelli, T.O. Menteş, M.A. Niño and M.S. Altman, J Matl. Chem. A 2, 1903-1913 (2014).
     
  • “Super-diffusive Motion of the Pb Wetting Layer on the Si(111) Surface”, K.L. Man, M.C. Tringides, M.M.T. Loy and M.S. Altman, Phys. Rev. Lett. 110, 036104 (2013).
     
  • “A Contrast Transfer Function Approach for Image Calculations in Standard and Aberration-Corrected LEEM and PEEM”, S.M. Schramm, A.B. Pang, M.S. Altman and R.M. Tromp, Ultramicroscopy 115, 88 (2012).
     
  • “Small-angle Lattice Rotations in Graphene on Ru(0001)”, K.L. Man and M.S. Altman, Phys. Rev. B 84, 235415 (2011).
     
  • “Superparamagnetic Limit to Spin-polarized Vacuum Tunneling from Fe-coated W(001) Tips”, Y.R. Niu and M.S. Altman, Appl. Phys. Lett. 95, 203113 (2009).
     
  • “Anomalous Mass Transport in the Pb Wetting Layer on the Si(111) Surface”, K.L. Man, M.C. Tringides, M.M.T. Loy and M.S. Altman, Phys. Rev. Lett. 101, 226102 (2008).
     
  • “Vibrational Entropy-Driven Dealloying of Mo(100) and W(100) Surface Alloys”, K.L. Man, Y.J. Feng, C.T. Chan, M.S. Altman, Surf. Sci. 601, L95 (2007).
     
  • “Spin-dependent Fabry-Pérot Interferometer of a Cu Thin Film Grown on fcc Co(001)” Y.Z. Wu, A.K. Schmid, M.S. Altman, X.F. Jin and Z.Q. Qiu, Phys. Rev. Lett. 94, 027201 (2005).
     
  • “Kinetic Limitations in Electronic Growth of Ag films on Fe(100)”, K.L. Man, Z.Q. Qiu, M.S. Altman, Phys. Rev. Lett. 93, 236104 (2004).
     
  • “Layer Spacings in Coherently Strained Epitaxial Metal Films”, W.F. Chung, Y.J. Feng, H.C. Poon, C.T. Chan, S.Y. Tong, M.S. Altman, Phys Rev. Lett. 90, 216105 (2003).
 Full Publication List [HKUST Scholarly Publications]
DEPARTMENT OF PHYSICS